ocivm.com > Spectroscopy Instrumentation > UHV Systems > Large Area Auger Depth Profiler LADP800

Series LADP800 Large Area Auger Depth Profiler

Model LADP800

Series LADP800, Large-Area Auger Depth Profiler
Series LADP800, Large-Area Auger Depth Profiler
Series LADP800, Large-Area Auger Depth Profiler
LADP800 in context

Large Area Auger Depth Profiler

Thin Film Elemental Composition at Different Depth

Model LADP800 is the compact instrument to measure elemental surface composition of thin films using Auger electron spectroscopy and Argon ion bombardment to obtain composition v.s depth. In addition, the instrument can integrate gas emission analysis from thin film.

Features:

  • Customized side UHV attachment to fit most of the vacuum deposition chambers.

Download Brochure:

Download the LADP800 Series Brochurepdf download icon

Specifications:

Specifications for LADP800 are currently available only upon request. Please contact us at OCI Vacuum Microengineering Inc. today.