ocivm.com > Spectroscopy Instrumentation > UHV Systems > Large Area Auger Depth Profiler LADP800
Model LADP800 is the compact instrument to measure elemental surface composition of thin films using Auger electron spectroscopy and Argon ion bombardment to obtain composition v.s depth. In addition, the instrument can integrate gas emission analysis from thin film.
Download the LADP800 Series Brochure