ocivm.com > Science & Applications > Posters & Video Presentations > Surface Crystallography Improvements Induced by Evaporated Ti Film on Selected Semiconductors

Surface Crystallography Improvements Induced by Evaporated Ti Film on Selected Semiconductors

Poster: "Surface Crystallography Improvements Induced by Evaporated Ti Film on Selected Semiconductors - LEED and AES Measurements"
by Jozef Ociepa, Paige Harford, Guenevere O'Hara & Bart Checinski

Downloads

Poster

Poster: Surface Crystallography Improvements Induced by Evaporated Ti Film on Selected Semiconductors - LEED and AES Measurements - by Jozef Ociepa, Paige Harford, Guenevere O'Hara & Bart Checinski. Follow one of the links above to download the PDF version.